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Probes
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Supersharp EBID carbon AFM probe with 2 nm tip radius on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Quartz like probe with more stability for contact mode.
f = 30 kHz | k = 0.1 N/m | tip coating: none
Silicon probe with no reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Quartz like probe with three cantilevers for contact mode.
f = 30 & 50 & 90 kHz | k = 0.06 & 0.1 & 0.3 N/m | tip coating: none
Silicon probe with no reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/Au
High performance EBID carbon AFM probe with guaranteed tip radius of 6-7 nm on soft 0.4 N/m cantilever.
f = 60 kHz | k = 0.4 N/m | tip coating: none
Quartz like probe with more stability for soft contact mode.
f = 11 kHz | k = 0.01 N/m | tip coating: none
Silicon probe with Al reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
EBD-FESPA: Diamond-like carbon probe with unrivaled lifetime. For uninterrupted AFM imaging in gentle tapping and non-contact mode in air.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Quartz like probe with two triangular cantilevers for contact mode.
f = 20 & 50 kHz | k = 0.08 & 0.3 N/m | tip coating: none
Silicon probe with sharp tip for high resolution imaging in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with short cantilever and Al reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe without reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with tip visible at end of lever for force modulation.
f = 85 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with short cantilever and no reflex coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Au reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with rotated tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and Al reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with visible tip apex for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.08 & 0.32 N/m | tip coating: none
Silicon probe with short cantilever without reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Pyrex probe with single nitride cantilever and tip for bio applications
f = 67 kHz | k =0.32 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and AL reflex coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: none
Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.06 & 0.48 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: none
Silicon probe for lateral force microscopy.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating and plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
High Q silicon probe with Al reflective coating for force modulation in vacuum.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Tipless soft cantilever.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with plateau tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Tipless cantilever.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with XY auto-alignment and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with plateau tip and Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Nitride probe; tipless; 2 levers; Au reflex coated
Contact mode with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 30 kHz | k = 0.5 N/m | tip coating: diamond tip
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