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Probes
ASYELEC.01-R2
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/IrStarting at: $350.00
AC240TSA-R3
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
EFM
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $419.00
AD-2.8-SS
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
AD-2.8-AS
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
ATEC-EFM
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $890.00
PPP-CONTSCAuD
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PPP-FMAuD
Silicon probe with Au reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: noneStarting at: $320.00
USC-F5-k30
Quartz-like material probe with carbon EBD tip for high speed imaging in tapping/non-contact mode.
To be used only on AFMs with small laser spot
f = 5000 kHz | k = 30 N/m | tip coating: noneStarting at: $980.00
PPP-CONTAuD
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: noneStarting at: $320.00
PNP-DB
Pyrex probe with two diving board nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.06 & 0.48 N/m | tip coating: noneStarting at: $440.00
ATEC-CONTAu
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $890.00
PPP-FMAu
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: AuStarting at: $384.00
PNP-TR
Pyrex probe with two triangular nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.08 & 0.32 N/m | tip coating: noneStarting at: $440.00
PNP-TR-Au
Pyrex probe with two triangular gold coated nitride cantilevers and tip for life science applications.
f = 17 & 67 kHz | k = 0.08 & 0.32 N/m | tip coating: AU(35)Starting at: $480.00
PNP-TRS
Pyrex probe with single nitride cantilever and tip for bio applications
f = 67 kHz | k =0.32 N/m | tip coating: none
PPP-CONTSCPt
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-CONTSCAu
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
Arrow EFM
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $407.00
PPP-CONTAu
Conductive silicon probe with Au tip coating for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
CONTPt
Test Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
PPP-CONTPt
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
Arrow CONTPt
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIrStarting at: $407.00
ATEC-FMAu
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: AuStarting at: $890.00
ATEC-CONTPt
Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $890.00
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