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Probes
Silicon probe with Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with Au reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with long cantilever for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamond
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamond
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with plateau tip with Al reflex coating.
f = 190 kHz | k = 48 N/m | tip coating: none
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