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Probes
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Silicon probe with Au reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with no reflex coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for tapping/non contact mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilevr and Au reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with Al reflex coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: none
Silicon probe with long cantilever and Al reflective coating for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with long cantilever for tapping/non contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and Al reflex coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: none
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamond
Silicon probe with long cantilever and Al reflex coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamond
Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.
f = 400 kHz | k = 80 N/m | tip coating: diamond
Silicon probe with long cantilever and no reflex coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: none
Silicon probe with diamond coated tip and long cantilever for tip degrading samples.
f = 210 kHz | k = 72 N/m | tip coating: diamond
Silicon probe with plateau tip for non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: none
Silicon probe with plateau tip with Al reflex coating.
f = 190 kHz | k = 48 N/m | tip coating: none
Specially designed probes for high mechanical loads and scratch testing applications.
For a similar probe but with a higher resolution tip, see NM-RC
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
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