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Probes
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with short cantilever and Al reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe without reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with visible tip apex for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever without reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: Au
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating and plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
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