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Probes
Silicon probe with visible apex tip for force modulation or soft tapping on medium to hard samples.
f = 150 kHz | k =9 N/m | tip coating: none
BioLever Mini; small nitride cantilever with silicon tip for tapping mode in liquid.
f = 110 kHz | k = 0.09 N/m | tip coating: none
Also known as OTESPA; silicon probe with visible apex tip for tapping mode.
f = 300 kHz | k = 26 N/m | tip coating: none
Also known as OLTESPA; medium soft cantilever for topgraphy and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with visible tip apex and Al reflex coating for high speed imaging.
f = 2000 kHz | tip coating: none
OLTESPA with Au reflective coating; medium soft cantilever for topography and viscoelasticity of soft samples.
f = 70 kHz | k = 2 N/m | tip coating: none
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 1500 kHz | tip coating: none
Silicon probe with visible tip apex and Au reflex coating for high speed imaging.
f = 2000 kHz | tip coating: none
Spherical EBID carbon AFM tips with various different radii for precise nanoindentation measurements and advanced data modelling.
tip radius = 20 - 2000 nm | k = 0.2 - 2000 N/m | tip coating: none
Silicon probe with Al reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with no reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflex coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with no reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with no reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflex coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with Al reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with short cantilever and Al reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe without reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with rotated tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with no reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and Al reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with short cantilever for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with rotated tip and Al reflective coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Au reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflex coating for contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever and Au reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Au reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with Al reflective coating for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Au reflective coating for soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with visible tip apex for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever and no reflex coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with short cantilever without reflective coating for contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: none
Silicon probe with plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with Al reflective coating and plateau tip for contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: none
Silicon probe with plateau tip for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Silicon probe with XY auto-alignment for soft tapping.
f = 160 kHz | k = 7.4 N/m | tip coating: none
Silicon probe with plateau tip and Al reflective coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: none
Contact mode with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 30 kHz | k = 0.5 N/m | tip coating: diamond tip
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