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Probes
ASYELEC.01-R2
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/IrStarting at: $350.00
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
ASYELEC.02
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/IrStarting at: $350.00
ASYELEC.02-R2
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/IrStarting at: $350.00
AC240TM-R3
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/PtStarting at: $350.00
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
AD-2.8-SS
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
SMIM150-G5
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/AuStarting at: $750.00
EFM
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $419.00
AD-2.8-AS
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
Econo-SCM-PIC
Platinum coated silicon probes for electrical characterization in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Cr/PtStarting at: $240.00
NCHPt
Silicon probe with PtIr coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $419.00
25PT300B
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: PtStarting at: $400.00
ATEC-EFM
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $890.00
CDT-FMR
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-NCHAu
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: AuStarting at: $384.00
NW-CDT-NCHR
Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,399.00
CDT-NCHR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,481.00
CDT-CONTR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamondStarting at: $1,481.00
Arrow NCPt
Silicon probe with PtIr coating for contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $370.00
NW-CDT-NCLR
Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,399.00
PPP-FMAu
Conductive silicon probe with Au coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: AuStarting at: $384.00
NCLPt
Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: PtIrStarting at: $419.00
PtSi-NCH
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSiStarting at: $1,481.00
PPP-NCSTAu
Conductive probe with Au coating for soft tapping mode electrical measurements.
f = 160 kHz | k = 7.4 N/m | tip coating: AuStarting at: $384.00
PPP-NCLAu
Conductive silicon probe with long cantilever for conductive measurements.
f = 190 kHz | k = 48 N/m | tip coating: AuStarting at: $384.00
PPP-CONTPt
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PtSi-CONT
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSiStarting at: $1,481.00
PPP-NCLPt
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-NCSTPt
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/IrStarting at: $449.00
Arrow EFM
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $370.00
PPP-NCHPt
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $449.00
ATEC-NCAu
Conductive silicon probe with Au tip coating and visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: AuStarting at: $890.00
ATEC-NCPt
Conductive probe with visible tip apex for electrical measurements.
f = 335 kHz | k = 45 N/m | tip coating: Pt/IrStarting at: $890.00
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