Product was successfully added to your shopping cart.
Go to cart page
Continue
Probes
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/Ir
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSi
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/Ir
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/Pt
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/Ir
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 180 kHz | k = 40 N/m | tip coating: diamond tip
Force modulation with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
Silicon probe with PtIr coating for tapping/non-contact mode.
f = 320 kHz | k = 42 N/m | tip coating: Pt/Ir
with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 180 kHz | k = 40 N/m | tip coating: diamond tip
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Force modulation probe with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 65 kHz | k = 2.8 N/m | tip coating: diamond tip
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Solid platinum probe for electrical measurements.
f = 4.5 kHz | k = 0.3 N/m | tip material: Pt
Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamond
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamond
Solid platinum probe for electrical measurements.
f = 20 kHz | k = 18 N/m | tip material: Pt
Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamond
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: Au
Silicon probe with long cantilever and PtIr coating for tapping/non-contact mode.
f = 190 kHz | k = 48 N/m | tip coating: PtIr
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamond
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSi
Silicon probe with PtIr coating for contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Pt/Ir
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIr
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/Ir
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSi
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/Ir
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/Ir
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Conductive probe with visible tip apex for electrical measurements.
f = 335 kHz | k = 45 N/m | tip coating: Pt/Ir
Contact mode with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
f = 30 kHz | k = 0.5 N/m | tip coating: diamond tip
Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
Specially designed probes for high mechanical loads and scratch testing applications.
For a similar probe but with a higher resolution tip, see NM-RC
f = 750 kHz | k = 350 N/m | tip coating: diamond tip
Please wait...
We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies from this website.