Americas
North America
South America
Canada
Australia
Probes
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
EFM
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $419.00
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
CDT-FMR
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamondStarting at: $1,481.00
NW-CDT-FMR
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamondStarting at: $1,399.00
CDT-NCHR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,481.00
ATEC-EFM
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $890.00
NW-CDT-NCHR
Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,399.00
ATEC-CONTAu
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $890.00
NW-CDT-NCLR
Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,399.00
CDT-CONTR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-CONTPt
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
ATEC-FMAu
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: AuStarting at: $890.00
PPP-NCSTPt
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/IrStarting at: $449.00
ATEC-CONTPt
Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $890.00
PPP-CONTSCAu
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
Arrow EFM
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $370.00
PPP-CONTSCPt
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PtSi-CONT
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSiStarting at: $1,481.00
CONTPt
Test Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
CDT-NCLR
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-CONTAu
Conductive silicon probe with Au tip coating for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
Arrow CONTPt
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIrStarting at: $370.00
© 2016 Oxford Instruments Asylum Research, Inc. All Rights Reserved.
