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Probes
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSi
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Silicon probe with PtIr coating for force modulation.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Nanoworld silicon probe with conductive diamond coating for tapping/non-contact mode.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamond
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamond
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamond
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamond
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamond
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: Au
Nanoworld silicon probe with long cantilever and conductive diamond coating for tapping/non-contact mode.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamond
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSi
Test Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamond
Conductive silicon probe with Au tip coating for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: Au
Silicon probe with tip at the end of cantilever and PtIr coating for contact mode.
f = 14 kHz | k =0.2 N/m | tip coating: PtIr
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: Au
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/Ir
Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: Pt/Ir
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: Au
Silicon probe with tip at the end of cantilever and PtIr coating for force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/Ir
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/Ir
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