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Probes

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9 Item(s)

  1. BL-TR400PB

    Nitride probe with two triangular cantilevers for iDrive mode.
    f = 10 & 32 kHz   |   k =0.02 & 0.09 N/m   |   tip coating: Cr/Au

    Starting at: $450.00

  2. BL-TR800PB

    Nitride probe with two triangular cantilevers for iDrive imaging.
    f = 22 & 68 kHz   |   k =0.16 & 0.61 N/m   |   tip coating: Cr/Au

    Starting at: $450.00

    In Stock

  3. ATEC-CONTAu

    Conductive silicon probe with visible tip apex for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $890.00

  4. PPP-CONTAu

    Conductive silicon probe with Au tip coating for contact mode electrical measurements.
    f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  5. ATEC-FMAu

    Conductive probe with tip visible at end of lever.
    f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Au

    Starting at: $890.00

  6. PPP-CONTSCAu

    Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
    f = 23 kHz   |   k = 0.2 N/m   |   tip coating: Au

    Starting at: $384.00

  7. NM-TC

    Specially designed probes for high mechanical loads and scratch testing applications. For a similar probe but with a higher resolution tip, see NM-RC
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: $750.00

    Ships in 4 Weeks

  8. AD-0.5-AS

    Contact mode with an apex sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.
    f = 30 kHz   |   k = 0.5 N/m   |   tip coating: diamond tip

    Starting at: $2,000.00

  9. NM-RC-C

    Specially designed probes for high mechanical loads and scratch testing applications. Each probe comes with a calibrated spring constant and high resolution SEM showing the tip radius and cone angle.
    f = 750 kHz   |   k = 350 N/m   |   tip coating: diamond tip

    Starting at: $2,500.00

    Ships in 4 Weeks

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9 Item(s)