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Probes
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/Ir
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/Ir
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/Ir
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 19 kHz | k = 1 N/m | tip coating: TiW/Au
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/Au
Solid platinum probe for electrical measurements.
f = 9 kHz | k = 0.8 N/m | tip material: Pt
Nitride probe with two triangular cantilevers for iDrive mode.
f = 10 & 32 kHz | k =0.02 & 0.09 N/m | tip coating: Cr/Au
Solid platinum probe for electrical measurements.
f = 100 kHz | k = 250 N/m | tip material: Pt
Solid platinum probe for electrical measurements.
f = 10 kHz | k = 8 N/m | tip material: Pt
Nitride probe with two triangular cantilevers for iDrive imaging.
f = 22 & 68 kHz | k =0.16 & 0.61 N/m | tip coating: Cr/Au
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