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Probes
ASYELEC.01-R2
Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements
f = 75 kHz | k = 2.8 N/m | tip coating: Ti/IrStarting at: $350.00
ASYELEC.02
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 300 kHz | k = 42 N/m | tip coating: Ti/IrStarting at: $350.00
ASYELEC.02-R2
Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode.
f = 285 kHz | k = 42 N/m | tip coating: Ti/IrStarting at: $350.00
PtSi-FM
Sharp conductive probe with PtSi coating for electrical measurements.
f = 75 kHz | k = 2.8 N/m | tip coating: PtSiStarting at: $1,481.00
AC240TM-R3
Also known as OSCM; conductive probe with visible apex tip for electrical measurement.
f = 70 kHz | k = 2 N/m | tip coating: Ti/PtStarting at: $400.00
PPP-EFM
Conductive probe for electrical measurements in force modulation mode.
f = 75 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $449.00
SMIM300-G5
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 19 kHz | k = 1 N/m | tip coating: TiW/AuStarting at: $750.00
SMIM150-G5
Nitride probe with shielded co-axial sensor specialized for sMIM applications.
f = 75 kHz | k = 8 N/m | tip coating: TiW/AuStarting at: $750.00
CDT-FMR
Silicon probe with conductive diamond coating for force modulation mode.
f = 105 kHz | k = 6.2 N/m | tip coating: conductive diamondStarting at: $1,481.00
CDT-NCHR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 400 kHz | k = 80 N/m | tip coating: conductive diamondStarting at: $1,481.00
ATEC-EFM
Conductive probe with visible tip apex for electrical measurements in modulation mode.
f = 85 kHz | k = 2.8 N/m | tip coating: Pt/IrStarting at: $890.00
PPP-NCHAu
Conductive silicon probe with Au tip coating for electrical measurements in non-contact/tapping mode.
f = 330 kHz | k = 42 N/m | tip coating: AuStarting at: $384.00
PtSi-NCH
Sharp conductive probe with PtSi coating for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: PtSiStarting at: $1,481.00
ATEC-CONTAu
Conductive silicon probe with visible tip apex for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $890.00
CDT-CONTR
Silicon probe with conductive diamond coated tip for electrical measurements.
f = 20 kHz | k = 0.5 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-NCLPt
Conductive probe with long cantilever for electrical measurements.
f = 190 kHz | k = 48 N/m | tip coating: Pt/IrStarting at: $449.00
ATEC-FMAu
Conductive probe with tip visible at end of lever.
f = 85 kHz | k = 2.8 N/m | tip coating: AuStarting at: $890.00
ATEC-CONTPt
Conductive probe with visible tip apex for electrical measurements in contact mode.
f = 15 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $890.00
PPP-CONTSCAu
Conductive silicon probe with short cantilever with Au tip coating for contact mode electrical measurements.
f = 23 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
PPP-NCSTPt
Conductive probe for electrical measurements in soft tapping mode.
f = 160 kHz | k = 7.4 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-CONTPt
Conductive probe for electrical measurements in contact mode.
f = 13 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
PPP-NCHPt
Conductive probe for electrical measurements.
f = 330 kHz | k = 42 N/m | tip coating: Pt/IrStarting at: $449.00
PtSi-CONT
Silicon probe with PtSi coating for contact mode
f = 13 kHz | k = 0.2 N/m | tip coating: PtSiStarting at: $1,481.00
PPP-CONTSCPt
Conductive probe with short cantilever for electrical measurements in contact mode.
f = 23 kHz | k = 0.2 N/m | tip coating: Pt/IrStarting at: $449.00
CDT-NCLR
Silicon probe with conductive diamond coated tip and long cantilever for electrical measurements.
f = 210 kHz | k = 72 N/m | tip coating: conductive diamondStarting at: $1,481.00
PPP-CONTAu
Conductive silicon probe with Au tip coating for contact mode electrical measurements.
f = 15 kHz | k = 0.2 N/m | tip coating: AuStarting at: $384.00
ATEC-NCPt
Conductive probe with visible tip apex for electrical measurements.
f = 335 kHz | k = 45 N/m | tip coating: Pt/IrStarting at: $890.00
ATEC-NCAu
Conductive silicon probe with Au tip coating and visible tip apex.
f = 335 kHz | k = 45 N/m | tip coating: AuStarting at: $890.00
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