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Quick Overview

Test Conductive probe with visible tip apex for electrical measurements in contact mode.

f = 13 kHz   |   k = 0.2 N/m   |   tip coating: Pt/Ir
Product Name Price Qty
CONTPt (50 Pack)
(Ships in 1-2 Weeks)
CONTPt (20 Pack)
(Ships in 1-2 Weeks)
CONTPt (10 Pack)
(Ships in 1-2 Weeks)


Contact Mode - PtIr5 coating
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm."

Cantilever Specifications
Spring k (N/m 0.2 (0.07 - 0.4)
Freq (kHz) 13 (9 - 17)
Length (µm) 450 (445 - 455)
Width (µm) 50 (45 - 55)
Thickness (µm) 2.0 (1.5 - 2.5)
Shape rectangular
Material Silicon
Reflex Coating (nm) Cr/PtIr (5/25)

Tip Specifications
Tip radius (nm) 25
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) Cr/PtIr (5/25)

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Additional Information

Tip Radius 25
Tip Radius > 20 nm
Spring Constant 0.2
Frequency 13
Compatibility blueDrive
Manufacturer Nanoworld

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