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Details
Contact Mode - PtIr5 coating
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm."
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm."
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 0.2 (0.07 - 0.4) |
| Freq (kHz) | 13 (9 - 17) |
| Length (µm) | 450 (445 - 455) |
| Width (µm) | 50 (45 - 55) |
| Thickness (µm) | 2.0 (1.5 - 2.5) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | Cr/PtIr (5/25) |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 25 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 25 +/- 2 |
| Back angle (°) | 15 +/- 2 |
| Side angle (°) | 22.5 +/- 2 |
| Tip shape | 4-sided |
| Tip material | Silicon |
| Tip coating (nm) | Cr/PtIr (5/25) |
Additional Information
| Tip Radius | 25 |
|---|---|
| Tip Radius | > 20 nm |
| Spring Constant | 0.2 |
| Frequency | 13 |
| Compatibility | blueDrive |
| Manufacturer | Nanoworld |
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