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Quick Overview

Silicon probe with visible tip apex.

f = 335 kHz   |   k = 45 N/m   |   tip coating: none
Product Name Price Qty
ATEC-NC (50 Pack)
(Ships in 1-2 Weeks)
ATEC-NC (20 Pack)
(Ships in 1-2 Weeks)
ATEC-NC (10 Pack)
(Ships in 1-2 Weeks)


Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode

NANOSENSORS™ AdvancedTEC™ NC AFM tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

Cantilever Specifications
Spring k (N/m 45 (12 - 110)
Freq (kHz) 335 (210 - 490)
Length (µm) 160 (150 - 170)
Width (µm) 45 (40 - 50)
Thickness (µm) 4.6 (3.6 - 5.6)
Shape Rectangular
Material Silicon
Reflex Coating (nm) None

Tip Specifications
Tip radius (nm) 10
Tip height (µm) 17.5 +/- 2.5
Front angle (°) -20 +/- 1
Back angle (°) 35 +/- 1
Side angle (°) 10 +/- 1
Tip shape 3-sided
Tip material Silicon
Tip coating (nm) None

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Additional Information

Tip Radius 10
Tip Radius 5-10 nm
Spring Constant 45
Frequency 335
Compatibility No
Manufacturer Nanosensors

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