ATEC-CONT

Advanced Tip at the End of the Cantilever™ Contact Mode

NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation). Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:

real tip visibility from top

typical tip radius of curvature better than 10 nm

tip height 15 - 20 µm

monolithic silicon

highly doped silicon to dissipate static charge

chemically inert

high mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m	0.2 (0.02 - 0.75)
Freq (kHz)	15 (7 - 25)
Length (µm)	450 (440 - 460)
Width (µm)	50 (45 - 55)
Thickness (µm)	2.0 (1.0 - 3.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	none

Tip Specifications
Tip radius (nm)	10
Tip height (µm)	17.5 +/- 2.5
Front angle (°)	-20 +/- 1
Back angle (°)	35 +/- 1
Side angle (°)	10 +/- 1
Tip shape	3-sided
Tip material	Silicon
Tip coating (nm)	none