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Arrow CONT

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Quick Overview

Silicon probe with tip at the end of cantilever and no reflex coating for contact mode.

f = 14 kHz   |   k =0.2 N/m   |   tip coating: none
Product Name Price Qty
Arrow CONT (50 Pack)
(Ships in 1-2 Weeks)
Arrow CONT (20 Pack)
(Ships in 1-2 Weeks)
Arrow CONT (10 Pack)
(Ships in 1-2 Weeks)


Contact Mode
NanoWorld Arrow™ CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.
Additionally, this probe offers a tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Cantilever Specifications
Spring k (N/m 0.2 (0.06 - 0.38)
Freq (kHz) 14 (10 - 19)
Length (µm) 450 (445 - 455)
Width (µm) 45 (40 - 50)
Thickness (µm) 2.0 (1.5 - 2.5)
Shape rectangular
Material Silicon
Reflex Coating (nm) none

Tip Specifications
Tip radius (nm) 10 +/- 2
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 20 +/- 1
Back angle (°) 35 +/- 1
Side angle (°) 30 +/- 1
Tip shape 3-sided
Tip material Silicon
Tip coating (nm) none

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Additional Information

Tip Radius 10
Tip Radius 5-10 nm
Spring Constant 0.2
Frequency 14
Compatibility No
Manufacturer Nanoworld

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