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Quick Overview

Solid platinum probe for electrical measurements.

f = 100 kHz   |   k = 250 N/m   |   tip material: Pt
Product Name Price Qty
25Pt200B-H (10-pack)
(Ships in 1-2 Weeks)
25Pt200B-H (5-pack)
(Ships in 1-2 Weeks)


The 25Pt200B-H has a high frequency for use in non-contact and tapping mode AFM measurements, especially c-AFM and KPFM.
Material: Solid platinum probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy.

Tip shank length: 80 μm (± 25%)
Cantilever length: 200 μm (± 15%)
Cantilever width: 50 μm (± 15%)
Spring constant: 250 N/m (± 40%)
Frequency: 100 kHz (± 30%)
Tip radius: < 20 nm
⚹ 10 nm tip radius available (part number: 25Pt200B-H10)
Untitled Document

Additional Information

Tip Radius 20
Tip Radius 10-20 nm
Spring Constant 250
Frequency 100
Compatibility No
Manufacturer Rocky Mountain

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