The 25Pt200B-H has a high frequency for use in non-contact and tapping mode AFM measurements, especially c-AFM and KPFM.
Material: Solid platinum probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy.
Tip shank length: 80 μm (± 25%)
Cantilever length: 200 μm (± 15%)
Cantilever width: 50 μm (± 15%)
Spring constant: 250 N/m (± 40%)
Frequency: 100 kHz (± 30%)
Tip radius: < 20 nm
⚹ 10 nm tip radius available (part number: 25Pt200B-H10)