PPP-RT-NCHR

PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

NANOSENSORS™ PPP-RT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:

guaranteed tip radius of curvature < 10 nm

tip height 10 - 15 µm

highly doped silicon to dissipate static charge

high mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m	42 (10 - 130)
Freq (kHz)	330 (204 - 497)
Length (µm)	125 (115 - 135)
Width (µm)	30 (22.5 - 37.5)
Thickness (µm)	4.0 (3.0 - 5.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al (30)

Tip Specifications
Tip radius (nm)	7
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	15 +/- 2
Back angle (°)	25 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none