Details
PointProbe® Plus Rotated Tip Non- Contact / Tapping Mode - High Resonance Frequency - Reflex Coating
NANOSENSORS™ PPP-RT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
The probe offers unique features:
guaranteed tip radius of curvature < 10 nm
tip height 10 - 15 µm
highly doped silicon to dissipate static charge
high mechanical Q-factor for high sensitivity
Cantilever Specifications
|
Spring k (N/m |
42 (10 - 130)
|
Freq (kHz) |
330 (204 - 497)
|
Length (µm) |
125 (115 - 135)
|
Width (µm) |
30 (22.5 - 37.5)
|
Thickness (µm) |
4.0 (3.0 - 5.0)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Al (30)
|
Tip Specifications
|
Tip radius (nm) |
7
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
15 +/- 2
|
Back angle (°) |
25 +/- 2
|
Side angle (°) |
22.5 +/- 2
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
none
|
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