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PPP-RT-FMR

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Quick Overview

Silicon probe with rotated tip for force modulation.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
Product Name Price Qty
PPP-RT-FMR (50 Pack)
(Ships in 1-2 Weeks)
$1,265.00
PPP-RT-FMR (20 Pack)
(Ships in 1-2 Weeks)
$573.00
PPP-RT-FMR (10 Pack)
(Ships in 1-2 Weeks)
$320.00

Details

PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series


    Cantilever Specifications
    Spring k (N/m 2.8 (0.5 - 9.5)
    Freq (kHz) 75 (45 - 115)
    Length (µm) 225 (215 - 235)
    Width (µm) 28 (20 - 35)
    Thickness (µm) 3.0 (2.0 - 4.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) Al (30)

    Tip Specifications
    Tip radius (nm) 7
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 15 ± 2º
    Back angle (°) 25 ± 2 º
    Side angle (°) 22.5 +/- 2 º
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) None

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    Additional Information

    Tip Radius 7
    Tip Radius 5-10 nm
    Spring Constant 2.8
    Frequency 75
    Compatibility No
    Manufacturer Nanosensors

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