PPP-RT-FMR

PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:

guaranteed tip radius of curvature < 10 nm

tip height 10 - 15 µm

highly doped to dissipate static charge

high mechanical Q-factor for high sensitivity

alignment grooves on backside of silicon holder chip

precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip

compatible with PointProbe® Plus XY-Alignment Series

Cantilever Specifications
Spring k (N/m	2.8 (0.5 - 9.5)
Freq (kHz)	75 (45 - 115)
Length (µm)	225 (215 - 235)
Width (µm)	28 (20 - 35)
Thickness (µm)	3.0 (2.0 - 4.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al (30)

Tip Specifications
Tip radius (nm)	7
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	15 ± 2º
Back angle (°)	25 ± 2 º
Side angle (°)	22.5 +/- 2 º
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	None