Details
PointProbe® Plus Rotated Tip Force Modulation Mode - Reflex Coating
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
The probe offers unique features:
guaranteed tip radius of curvature < 10 nm
tip height 10 - 15 µm
highly doped to dissipate static charge
high mechanical Q-factor for high sensitivity
alignment grooves on backside of silicon holder chip
precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series
Cantilever Specifications
|
Spring k (N/m |
2.8 (0.5 - 9.5)
|
Freq (kHz) |
75 (45 - 115)
|
Length (µm) |
225 (215 - 235)
|
Width (µm) |
28 (20 - 35)
|
Thickness (µm) |
3.0 (2.0 - 4.0)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Al (30)
|
Tip Specifications
|
Tip radius (nm) |
7
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
15 ± 2º
|
Back angle (°) |
25 ± 2 º
|
Side angle (°) |
22.5 +/- 2 º
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
None
|
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