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PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - Au coating
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.
NANOSENSORS™ PPP-NCHAu AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high electrical conductivity with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
• Metallic conductivity of the tip
• Tip height 10 - 15 µm
• Au coating on detector side of cantilever
• Chemically inert
A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.
Note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.
Spring k (N/m
42 (10 - 130)
330 (204 - 497)
125 (115 - 135)
30 (22.5 - 37.5)
4.0 (3.0 - 5.0)
Reflex Coating (nm)
Tip radius (nm)
Tip height (µm)
12.5 +/- 2.5
Front angle (°)
25 +/- 2
Back angle (°)
15 +/- 2
Side angle (°)
22.5 +/- 2
Tip coating (nm)
> 20 nm
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