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Point Probe® Plus Magnetic Force Microscopy - Low Momentum - Reflex Coating
The NANOSENSORS™ PPP-LM-MFMR AFM probe is designed for magnetic force microscopy with reduced disturbance of the magnetic sample by the tip and enhanced lateral resolution - compared to the standard PPP-MFMR probe. The force constant of this probe type is specially tailored for magnetic force microscopy yielding high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
The hard magnetic coating on the tip is characterized by a coercivity of app. 250 Oe and a remanence magnetization of app. 150 emu/cm3 (these values were determined on a flat surface).
The SPM probe offers unique features:
hard magnetic coating on the tip side (coercivity of app. 250 Oe, remanence magnetization of app. 150 emu/cm3)
effective magnetic moment 0.5x of standard probes
metallic electrical conductivity
guaranteed tip radius of curvature < 30 nm
magnetic resolution better than 35 nm
tip height 10 - 15 µm
Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
alignment grooves on backside of silicon holder chip
precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series
As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.
The NANOSENSORS™ PPP-LM-MFMR AFM probe is designed for magnetic force microscopy with reduced disturbance of the magnetic sample by the tip and enhanced lateral resolution - compared to the standard PPP-MFMR probe. The force constant of this probe type is specially tailored for magnetic force microscopy yielding high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
The hard magnetic coating on the tip is characterized by a coercivity of app. 250 Oe and a remanence magnetization of app. 150 emu/cm3 (these values were determined on a flat surface).
The SPM probe offers unique features:
As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 2.8 (0.5 - 9.5) |
| Freq (kHz) | 75 (45 - 115) |
| Length (µm) | 225 (215 - 235) |
| Width (µm) | 28 (20 - 35) |
| Thickness (µm) | 3.0 (2.0 - 4.0) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | Al (30) |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 23 +/- 7 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 25 +/- 2 |
| Back angle (°) | 15 +/- 2 |
| Side angle (°) | 22.5 +/- 2 |
| Tip shape | 4-sided |
| Tip material | Silicon |
| Tip coating (nm) | Co alloy (20) |
Additional Information
| Tip Radius | 23 |
|---|---|
| Tip Radius | > 20 nm |
| Spring Constant | 2.8 |
| Frequency | 75 |
| Compatibility | blueDrive |
| Manufacturer | Nanosensors |
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