PPP-FMAuD

PointProbe® Plus Force Modulation Mode - Au coating (Detector side)

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

Guaranteed tip radius of curvature < 10 nm

Tip height 10 - 15 µm

Highly doped silicon to dissipate static charge

Au coating on detector side of cantilever

Chemically inert

A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

Cantilever Specifications
Spring k (N/m	2.8 (0.5 - 9.5)
Freq (kHz)	75 (45 - 115)
Length (µm)	225 (215 - 235)
Width (µm)	28 (20 - 35)
Thickness (µm)	3.0 (2.0 - 4.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Cr/Au (5/35)

Tip Specifications
Tip radius (nm)	7
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none