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Details
PointProbe® Plus Force Modulation Mode - Au coating (Detector side)
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
Guaranteed tip radius of curvature < 10 nm
Tip height 10 - 15 µm
Highly doped silicon to dissipate static charge
Au coating on detector side of cantilever
Chemically inert
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 2.8 (0.5 - 9.5) |
| Freq (kHz) | 75 (45 - 115) |
| Length (µm) | 225 (215 - 235) |
| Width (µm) | 28 (20 - 35) |
| Thickness (µm) | 3.0 (2.0 - 4.0) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | Cr/Au (5/35) |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 7 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 25 +/- 2 |
| Back angle (°) | 15 +/- 2 |
| Side angle (°) | 22.5 +/- 2 |
| Tip shape | 4-sided |
| Tip material | Silicon |
| Tip coating (nm) | none |
Additional Information
| Tip Radius | 7 |
|---|---|
| Tip Radius | 5-10 nm |
| Spring Constant | 2.8 |
| Frequency | 75 |
| Compatibility | blueDrive |
| Manufacturer | Nanosensors |
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