Details
PointProbe® Plus Force Modulation Mode - Au coating (Detector side)
The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAuD is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
Guaranteed tip radius of curvature < 10 nm
Tip height 10 - 15 µm
Highly doped silicon to dissipate static charge
Au coating on detector side of cantilever
Chemically inert
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
Cantilever Specifications
|
Spring k (N/m |
2.8 (0.5 - 9.5)
|
Freq (kHz) |
75 (45 - 115)
|
Length (µm) |
225 (215 - 235)
|
Width (µm) |
28 (20 - 35)
|
Thickness (µm) |
3.0 (2.0 - 4.0)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Cr/Au (5/35)
|
Tip Specifications
|
Tip radius (nm) |
7
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
25 +/- 2
|
Back angle (°) |
15 +/- 2
|
Side angle (°) |
22.5 +/- 2
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
none
|
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