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Quick Overview

Conductive silicon probe with Au tip coating for contact mode electrical measurements.

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au
Product Name Price Qty
PPP-CONTAu (10 Pack)
(Ships in 1-2 Weeks)


PointProbe® Plus Contact Mode - Au Coating

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.
NANOSENSORS™ PPP-CONTAu probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Cantilever Specifications
Spring k (N/m 0.2 (0.02 - 0.77)
Freq (kHz) 13 (6 - 21)
Length (µm) 450 (440 - 460)
Width (µm) 50 (42.5 - 57.5)
Thickness (µm) 2.0 (1.0 - 3.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Cr/Au (5/35)

Tip Specifications
Tip radius (nm) 50
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) Cr/Au (5/35)

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Additional Information

Tip Radius 50
Tip Radius 5-10 nm
Spring Constant 0.2
Frequency 15
Compatibility blueDrive
Manufacturer Nanosensors

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