NW-SSS-NCH

SuperSharpSilicon™ - Non-Contact / Tapping Mode - High Resonance Frequency

NanoWorld Pointprobe® SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

Guaranteed tip radius of curvature < 5 nm

Typical tip radius of curvature of 2 nm

Typical aspect ratio at 200 nm from tip apex in the order of 4:1

Half cone angle at 200 nm from apex < 10°

Monolithic material

Highly doped to dissipate static charge

Chemically inert

High mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m)	42 (10 - 130)
Freq (kHz)	320 (204 - 497)
Length (µm)	125 (115 - 135)
Width (µm)	30 (30 - 45)
Thickness (µm)	4.0 (3 - 5)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	none

Tip Specifications
Tip radius (nm)	2
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none