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Details
SuperSharpSilicon™ - Non-Contact / Tapping Mode - High Resonance Frequency
NanoWorld Pointprobe® SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The probe offers unique features:
Guaranteed tip radius of curvature < 5 nm
Typical tip radius of curvature of 2 nm
Typical aspect ratio at 200 nm from tip apex in the order of 4:1
Half cone angle at 200 nm from apex < 10°
Monolithic material
Highly doped to dissipate static charge
Chemically inert
High mechanical Q-factor for high sensitivity
NanoWorld Pointprobe® SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The probe offers unique features:
| Cantilever Specifications | |
|---|---|
| Spring k (N/m) | 42 (10 - 130) |
| Freq (kHz) | 320 (204 - 497) |
| Length (µm) | 125 (115 - 135) |
| Width (µm) | 30 (30 - 45) |
| Thickness (µm) | 4.0 (3 - 5) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | none |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 2 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 25 +/- 2 |
| Back angle (°) | 15 +/- 2 |
| Side angle (°) | 22.5 +/- 2 |
| Tip shape | 4-sided |
| Tip material | Silicon |
| Tip coating (nm) | none |
Additional Information
| Tip Radius | 2 |
|---|---|
| Tip Radius | 1-5 nm |
| Spring Constant | 42 |
| Frequency | 320 |
| Compatibility | No |
| Manufacturer | Nanoworld |
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