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NW-SSS-NCH

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Quick Overview

Silicon probe with sharp tip for high resolution imaging in tapping/non-contact mode.

f = 320 kHz   |   k = 42 N/m   |   tip coating: none
Product Name Price Qty
NW-SSS-NCH (Wafer)
(Ships in 1-2 Weeks)
$13,995.00
NW-SSS-NCH (50 Pack)
(Ships in 1-2 Weeks)
$2,988.00
NW-SSS-NCH (20 Pack)
(Ships in 1-2 Weeks)
$1,252.00
NW-SSS-NCH (10 Pack)
(Ships in 1-2 Weeks)
$699.00

Details

SuperSharpSilicon™ - Non-Contact / Tapping Mode - High Resonance Frequency

NanoWorld Pointprobe® SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:
  • Guaranteed tip radius of curvature < 5 nm
  • Typical tip radius of curvature of 2 nm
  • Typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • Half cone angle at 200 nm from apex < 10°
  • Monolithic material
  • Highly doped to dissipate static charge
  • Chemically inert
  • High mechanical Q-factor for high sensitivity


    Cantilever Specifications
    Spring k (N/m) 42 (10 - 130)
    Freq (kHz) 320 (204 - 497)
    Length (µm) 125 (115 - 135)
    Width (µm) 30 (30 - 45)
    Thickness (µm) 4.0 (3 - 5)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) none

    Tip Specifications
    Tip radius (nm) 2
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) none

  • Untitled Document

    Additional Information

    Tip Radius 2
    Tip Radius 1-5 nm
    Spring Constant 42
    Frequency 320
    Compatibility No
    Manufacturer Nanoworld

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