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Quick Overview

Silicon probe with diamond coated tip and long cantilever for tip degrading samples.

f = 210 kHz   |   k = 72 N/m   |   tip coating: diamond
Product Name Price Qty
NW-DT-NCLR (Wafer)
(Ships in 1-2 Weeks)
NW-DT-NCLR (50 Pack)
(Ships in 1-2 Weeks)
NW-DT-NCLR (20 Pack)
(Ships in 1-2 Weeks)
NW-DT-NCLR (10 Pack)
(Ships in 1-2 Weeks)


Diamond Coated Tip - Non-Contact/Tapping Mode - Long Cantilever - Reflex Coating

NanoWorld Pointprobe® DT-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non-contact probee (NCH). The NCL type cantilever is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

Cantilever Specifications
Spring k (N/m 72 (34 - 142)
Freq (kHz) 210 (155 - 275)
Length (µm) 225 (215 - 235)
Width (µm) 38 (30 - 45)
Thickness (µm) 7.0 (6.0 - 8.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Al (30)

Tip Specifications
Tip radius (nm) 150 +/- 50
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) diamond (100)

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Additional Information

Tip Radius 150
Tip Radius > 20 nm
Spring Constant 72
Frequency 210
Compatibility No
Manufacturer Nanoworld

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