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Quick Overview

Silicon probe with diamond coated tip for tapping/non-contact mode on tip degrading samples.

f = 400 kHz   |   k = 80 N/m   |   tip coating: diamond
Product Name Price Qty
NW-DT-NCHR (Wafer)
(Ships in 1-2 Weeks)
NW-DT-NCHR (50 Pack)
(Ships in 1-2 Weeks)
NW-DT-NCHR (20 Pack)
(Ships in 1-2 Weeks)
NW-DT-NCHR (10 Pack)
(Ships in 1-2 Weeks)


Diamond Coated Tip - Non-Contact/Tapping Mode - High Resonance Frequency - Reflex Coating

NanoWorld Pointprobe® DT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

Cantilever Specifications
Spring k (N/m 80 (23 - 225)
Freq (kHz) 400 (225 - 610)
Length (µm) 125 (115 - 135)
Width (µm) 30 (22.5 - 37.5)
Thickness (µm) 4.0 (3.0 - 5.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Al (30)

Tip Specifications
Tip radius (nm) 150 +/- 50
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) diamond (100)

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Additional Information

Tip Radius 150
Tip Radius > 20 nm
Spring Constant 80
Frequency 400
Compatibility No
Manufacturer Nanoworld

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