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EFM

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Quick Overview

Silicon probe with PtIr coating for force modulation.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Pt/Ir
Product Name Price Qty
EFM (50 Pack)
(Ships in 1-2 Weeks)
$1,657.00
EFM (20 Pack)
(Ships in 1-2 Weeks)
$751.00
EFM (10 Pack)
(Ships in 1-2 Weeks)
$419.00

Details

Electrostatic Force Microscopy - PtIr5 coating
NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm.


Cantilever Specifications
Spring k (N/m 2.8 (1.2 - 5.5)
Freq (kHz) 75 (60 - 90)
Length (µm) 225 (220 - 230)
Width (µm) 28 (22.5 - 32.5)
Thickness (µm) 3.0 (2.5 - 3.5)
Shape rectangular
Material Silicon
Reflex Coating (nm) Cr/PtIr (5/25)

Tip Specifications
Tip radius (nm) 25
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) Cr/PtIr (5/25)

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Additional Information

Tip Radius 25
Tip Radius > 20 nm
Spring Constant 2.8
Frequency 75
Compatibility blueDrive
Manufacturer Nanoworld

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