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Quick Overview

Silicon probe with Al reflex coating and diamond coated tip for contact mode on tip degrading samples.

f = 20 kHz   |   k = 0.5 N/m   |   tip coating: diamond

Product Name Price Qty
DT-CONTR (50 Pack)
(Ships in 1-2 Weeks)
DT-CONTR (20 Pack)
(Ships in 1-2 Weeks)
DT-CONTR (10 Pack)
(Ships in 1-2 Weeks)


Diamond Coated Tip - Contact Mode - Reflex Coating

NANOSENSORS™ DT-CONTR probes are designed for contact mode (repulsive mode) AFM imaging. The CONT type is optimized for high sensitivity due to a low force constant.
For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The probe offers unique features:
  • real diamond coating
  • tip height 10 - 15 µm
  • high mechanical Q-factor for high sensitivity

    The DT Diamond Coating is an approximately 100 nm thick coating of polycrystalline diamond on the tip-side of the cantilever leading to an unsurpassed hardness of the tip. The raman spectrum of the coating verifies the real diamond coating.

    Cantilever Specifications
    Spring k (N/m 0.2 (0.02 - 0.77)
    Freq (kHz) 13 (6 - 21)
    Length (µm) 450 (440 - 460)
    Width (µm) 50 (42.5 - 57.5)
    Thickness (µm) 2.0 (1.0 - 3.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) Al (30)

    Tip Specifications
    Tip radius (nm) 150 +/- 50
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) diamond (100)

  • Untitled Document

    Additional Information

    Tip Radius 150
    Tip Radius > 20 nm
    Spring Constant 0.5
    Frequency 20
    Compatibility No
    Manufacturer Nanosensors

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