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Conductive Diamond Coated Tip - Contact Mode - Reflex Coating
NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 0.2 (0.02 - 0.77) |
| Freq (kHz) | 13 (6 - 21) |
| Length (µm) | 450 (440 - 460) |
| Width (µm) | 50 (42.5 - 57.5) |
| Thickness (µm) | 2.0 (1.0 - 3.0) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | Al (30) |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 150 +/- 50 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 25 +/- 2 |
| Back angle (°) | 15 +/- 2 |
| Side angle (°) | 22.5 +/- 2 |
| Tip shape | 4-sided |
| Tip material | Silicon |
| Tip coating (nm) | doped diamond (100) |
Additional Information
| Tip Radius | 150 |
|---|---|
| Tip Radius | > 20 nm |
| Spring Constant | 0.5 |
| Frequency | 20 |
| Compatibility | blueDrive |
| Manufacturer | Nanosensors |
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