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Details
Advanced Tip at the End of the Cantilever™ Force Modulation Mode
NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features:
real tip visibility from top
typical tip radius of curvature better than 10 nm
tip height 15 - 20 µm
monolithic silicon
highly doped silicon to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity
NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features:
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 2.8 (0.7 - 9.0) |
| Freq (kHz) | 85 (50 - 130) |
| Length (µm) | 240 (230 - 250) |
| Width (µm) | 35 (30 - 40) |
| Thickness (µm) | 3.0 (2.0 - 4.0) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | none |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 10 |
| Tip height (µm) | 17.5 +/- 2.5 |
| Front angle (°) | -20 +/- 1 |
| Back angle (°) | 35 +/- 1 |
| Side angle (°) | 10 +/- 1 |
| Tip shape | 3-sided |
| Tip material | Silicon |
| Tip coating (nm) | none |
Additional Information
| Tip Radius | 10 |
|---|---|
| Tip Radius | 5-10 nm |
| Spring Constant | 2.8 |
| Frequency | 85 |
| Compatibility | No |
| Manufacturer | Nanosensors |
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