ATEC-FM

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:

real tip visibility from top

typical tip radius of curvature better than 10 nm

tip height 15 - 20 µm

monolithic silicon

highly doped silicon to dissipate static charge

chemically inert

high mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m	2.8 (0.7 - 9.0)
Freq (kHz)	85 (50 - 130)
Length (µm)	240 (230 - 250)
Width (µm)	35 (30 - 40)
Thickness (µm)	3.0 (2.0 - 4.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	none

Tip Specifications
Tip radius (nm)	10
Tip height (µm)	17.5 +/- 2.5
Front angle (°)	-20 +/- 1
Back angle (°)	35 +/- 1
Side angle (°)	10 +/- 1
Tip shape	3-sided
Tip material	Silicon
Tip coating (nm)	none