Details
Arrow™ - Non-contact / Tapping™ mode - Reflex coating
Optimized positioning through maximized tip visibility
NanoWorld Arrow™ NC probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.
Additionally, this probe offers a typical tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
Cantilever Specifications
|
Spring k (N/m |
42 (27 - 80)
|
Freq (kHz) |
285 (240 - 380)
|
Length (µm) |
160 (155 - 165)
|
Width (µm) |
45 (40 - 50)
|
Thickness (µm) |
4.6 (4.1 - 5.1)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Al (30)
|
Tip Specifications
|
Tip radius (nm) |
10 +/- 2
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
20 +/- 1
|
Back angle (°) |
35 +/- 1
|
Side angle (°) |
30 +/- 1
|
Tip shape |
3-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
none
|
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