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Quick Overview

Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime.

f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip

Product Name Price Qty
AD-40-SS (5 Pack)
(Ships in 3 Weeks)


Highly conductive Super Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

Cantilever Specifications
Spring k (N/m) 40 (20 - 60)
Freq (kHz) 180 (100 - 300)
Length (µm) 225 (215 - 235)
Width (µm) 28 (23 - 33)
Thickness (µm) 3 (2.5 - 3.5)
Shape Rectangular
Material Diamond coated silicon
Reflex Coating Gold

Bulk Tip Specifications
Bulk Tip Geometry Rotated (Symmetric)
Bulk Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 5
Back angle (°) 15 +/- 5
Side angle (°) 22.5 +/- 5
Tip Setback (µm) 15 +/- 10

Single Crystal Diamond Tip Specifications
Tip shape Cone
Guaranteed Tip radius (nm) < 5
Tip height (nm) 300 +/- 100
Tip angle (°) 30 +/- 5
Tip material Single crystal diamond

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Additional Information

Tip Radius 5
Tip Radius 1-5 nm
Spring Constant 40
Frequency 180
Compatibility No
Manufacturer Adama Innovations

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