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Quick Overview

Nanosensors Flatness Standard for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10nm on a 100x100µm2 area.
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NANOSENSORS™ flatness standard consists of a superflat plane and is intended to be used to analyze and correct the scanner bow of the piezo-scanner used in most Scanning Force Microscopes. The standard consists of a quartz substrate with a chromium layer.

  • maximum peak to valley (p-v) of 10 nm on a 100µmx 100µm area
  • FindMe pattern for easy localisation of active area
  • available with certificate

  • This standard has been developed in close cooperation with the German national authority of standards: PTB (Physikalisch Technische Bundesanstalt). Due to this PTB is able to certify this standard in accordance with international guidelines. Please contact Working Group 5.25 Scanning Probe Metrology at directly.
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    Additional Information

    Tip Radius No
    Tip Radius No
    Spring Constant No
    Frequency No
    Compatibility No
    Manufacturer Nanosensors

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