0item(s)

You have no items in your shopping cart.

Product was successfully added to your shopping cart.

FLAT

Be the first to review this product

Quick Overview

Nanosensors Flatness Standard for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10nm on a 100x100µm2 area.
Product Name Price Qty
FLAT
(Ships in 3 Weeks)
$800.00

Details


NANOSENSORS™ flatness standard consists of a superflat plane and is intended to be used to analyze and correct the scanner bow of the piezo-scanner used in most Scanning Force Microscopes. The standard consists of a quartz substrate with a chromium layer.

Feautures:
  • maximum peak to valley (p-v) of 10 nm on a 100µmx 100µm area
  • FindMe pattern for easy localisation of active area
  • available with certificate


  • This standard has been developed in close cooperation with the German national authority of standards: PTB (Physikalisch Technische Bundesanstalt). Due to this PTB is able to certify this standard in accordance with international guidelines. Please contact Working Group 5.25 Scanning Probe Metrology at www.ptb.de directly.
    Untitled Document

    Additional Information

    Tip Radius No
    Tip Radius No
    Spring Constant No
    Frequency No
    Compatibility No
    Manufacturer Nanosensors

    Product Tags

    Use spaces to separate tags. Use single quotes (') for phrases.

    1. Be the first to review this product

    Write Your Own Review

    Only registered users can write reviews. Please, log in or register